Unified Methods for VLSI Simulation and Test Generation

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Unified Methods for VLSI Simulation and...

Unified Methods for VLSI Simulation and Test Generation

Kwang-Ting (Tim) Cheng, Vishwani D. Agrawal

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როგორ მოგეწონათ ეს წიგნი?

როგორი ხარისხისაა ეს ფაილი?

ჩატვირთეთ, ხარისხის შესაფასებლად

როგორი ხარისხისაა ჩატვირთული ფაილი?

ტომი:

73

წელი:

1989

გამომცემლობა:

Springer

ენა:

english

გვერდები:

148

ISBN 10:

0792390253

ISBN 13:

9780792390251

სერია:

Kluwer international series in engineering and computer science, 73

ფაილი:

PDF, 6.39 MB

IPFS:

,

english, 1989

ონლაინ წაკითხვა

ხორციელდება კონვერტაციის -ში

კონვერტაციის -ში ვერ მოხერხდა

შესაძლოა დაგაინტერესოთ

Charles E. Stroud (auth.) — A Designer’s Guide to Built-In Self-Test

G. Russell, I. Sayers — Advanced Simulation and Test Methodols for VLSI Design

M. Bushnell, V. Agrawal — Essentials of Electronic Testing - For Digital, Memory and Mixed-Signal VLSI Circuits

Unknown — "Automatic Testing". In: Wiley Encyclopedia of Electrical and Electronics Engineering

M. L. Bushnell and V. D. Agrawal — Solutions to Problems from Essentials of Electronic Testing

Frank F. Tsui — Lsi/Vlsi Testability Design

Richard J. Peterson — Power-Constrained Testing Of Vlsi Circuits

Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen — VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon)

Norman G. Einspruch — Vlsi Design

Marg Karpovsky (Eds.) — Spectral Techniques and Fault Detection

A F Schwarz — Handbook of VLSI chip design and expert systems

Francis C. Wang — Digital Circuit Testing: A Guide to DFT and Other Techniques

Hideo Fujiwara — Logic testing and design for testability

Katarzyna Radecka, Zeljko Zilic — Verification by Error Modeling: Using Testing Techniques in Hardware Verification (Frontiers in Electronic Testing)

Reiner W. Hartenstein — Hardware Description Languages

John G. Webster (Editor) — 13.Computer-Aided Design of Integrated Circuits

Alexander Miczo — Digital Logic Testing and Simulation

Frederick J. Hill, Gerald R. Peterson — Computer Aided Logical Design with Emphasis on VLSI

N. K. Jha, S. Gupta — Testing of Digital Systems

J B Gosling — Simulation in the design of digital electronic systems

John B. Gosling — Simulation in the Design of Digital Electronic Systems

M. Bushnell; Vishwani Agrawal — Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

M. Bushnell, Vishwani Agrawal — Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits

Hurst, Stanley Leonard — VLSI testing : digital and mixed analogue/digital techniques

Vasant B. Rao, David V. Overhauser, Timothy N. Trick, Ibrahim N. Hajj — Switch-Level Timing Simulation of MOS VLSI Circuits

Charles E. Stroud — A Designer s Guide to Built-in Self-Test

Katarzyna Radecka, Zeljko Zilic — Verification by Error Modeling: Using Testing Techniques in Hardware Verification

Zainalabedin Navabi (auth.) — Digital System Test and Testable Design: Using HDL Models and Architectures

Shi-Yu Huang, Kwang-Ting (Tim) Cheng (auth.) — Formal Equivalence Checking and Design Debugging

Raimund Ubar, Raimund Ubar, Jaan Raik, Heinrich Theodor Vierhaus — Design and Test Technology for Dependable Systems-on-Chip

Ubar, Raimund; Raik, Jaan; Vierhaus, Heinrich Theodor — Design and Test Technology for Dependable Systems-on-Chip

Prof. Tinghuai Chen (auth.) — Fault Diagnosis and Fault Tolerance: A Systematic Approach to Special Topics

F. Lombardi, M.G. Sami — Testing and Diagnosis of VLSI and ULSI

Smita Krishnaswamy, Igor L. Markov, John P. Hayes (auth.) — Design, Analysis and Test of Logic Circuits Under Uncertainty

T. W. Williams (auth.), Fabrizio Lombardi, Mariagiovanna Sami (eds.) — Testing and Diagnosis of VLSI and ULSI

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